Spectroscopic ellipsometer family SENresearch

SE800DUV_Camera_Microspots_367px

Widest spectral range

The SENresearch ellipsometer family covers the widest spectral rangeSENresearch_Spectralbereiche_300px from 190 nm (deep UV) to 3,500 nm (NIR) in one tool. FTIR is applied in the near infrared, allowing an extension to 3,500 nm at highest spectral resolution and speed.

Step Scan Analyzer principle:

The Step Scan Analyzer principle is a unique feature of the SENTECH ellipsometer family. During data acquisition, polarizer and wide band compensator are fixed to provide highest accuracy of the ellipsometric measurement.

The SENresearch measures thin film thickness, refractive index, extinction coefficient, and related properties of bulk materials, single layers, and multi‑layer stacks. Isotropic and anisotropic materials, surface and interface roughness as well as gradients can be analyzed. Furthermore, SpectraRay/3, SENTECH proprietary ellipsometer software, treats sample effects like depolarization, non-uniformity, scattering (Mueller-matrix), and backside reflection.

The SENresearch represents the high end of SENTECH ellipsometers. The compact table top instrument comprises the ellipsometer optics, goniometer, sample platform, auto-collimating telescope, light source, and detection unit. It can be extended by a variety of optionsSEN_glossar-options_150px Options: Spectral ranges Automated goniometer Microspot Mapping stages
(50x50 – 300x300 mm)
Autofocus, -alignment Video camera Reflectometer Sample cells Heating stage Cryostat
for any R & D and routine application.

The SENresearch is focused on speed and accuracy for insitu and exsitu measurements of thin films wherever they are applied. Applications range from measuring on textured surfaces to determining the conductivity of TCO films, from insitu monitoring of deposition processes to offline mapping on large glass panels. With the latest development launched by SENTECH, magneto‑opticalSGME-Controller_550px Spectral generalized magneto-optical ellipsometer – combined Kerr spectroscopy, MOKE, and spectroscopic ellipsometry properties can be characterized. For a large variety of applicationsSEN_glossar-applications_150pxApplications in: R&D Nanotechnology Photovoltaics Microelectronics Optoelectronics Organic electronics Glass coatings Display technology Bioscience Life science predefined recipes are offered by SpectraRay/3.

SpectraRay/3

SENTECH's proprietary ellipsometer software SpectraRay/3 comprises two modes of operation: recipe mode and interactive mode. The recipe modeSpectraRay_Rezeptauswahl_280px SpectraRay/3 recipe mode: Recipe selection allows for easy execution of repetitive applications. In interactive modeSEN_interactive_280px SpectraRay/3 interactive mode: Modeling, ellipsometric measurements are enhanced by an interactive, guiding graphical user interface.

Large materials database and all applicable dispersion models are included. Multiple angle of incidence, multiple sample, and combined photometric measurements are supported by SpectraRay/3.

SpectraRay/3

SENTECH's proprietary ellipsometer software SpectraRay/3 comprises two modes of operation: recipe mode and interactive mode. The recipe modeSpectraRay_Rezeptauswahl_280px SpectraRay/3 recipe mode: Recipe selection allows for easy execution of repetitive applications. In interactive modeSEN_interactive_280px SpectraRay/3 interactive mode: Modeling, ellipsometric measurements are enhanced by an interactive, guiding graphical user interface.

Large materials database and all applicable dispersion models are included. Multiple angle of incidence, multiple sample, and combined photometric measurements are supported by SpectraRay/3.

SE850DUV_FTIR2_550pxSENresearch_Spectralbereiche_550pxSEN_goniometer_550pxSEN_automated-goniometerSE800DUV_Camera_550pxSE850DUV_r-theta-tischSE850DUV_x-y-z-tisch_550pxSEN_MappingSE800DUV_Goniometer_SiBall_MicroSpots_550pxGoniometer_20deg_550pxSE800_Transmission_550pxSEN_reflectometerSE801EVG_550pxSE801_550pxLiquidCell_550pxHeiztisch_550pxSENresearch Cryostat_550pxSGME-Controller_550pxSGME_Messung_550px

Documents   To get more information, please click here.

Documents   To get more information, please click here.