Product News
07/01/2010RM 2000 for contactless optical reflection measurement
SENTECH launched the new FTP advanced reflectometer RM 2000 with spectral range from 200 nm to 930 nm and micro spot of 100 µm. The RM 2000 is especially suited for the characterization of bulk materials, thin films and layer stacks by optical reflection measurements. Through a spectral range extension and a reduction of the spot size, the RM 2000 is able to measure the uniformity of AR coatings, filters and composition (GaAIN) in the DUV-VIS spectral range. The instrument is supplied with
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